× "Application Specific Integrated Circuits: Technologies, Digital Systems and Design Methodologies" ed. by Edward Fisher Close
"Application Specific Integrated Circuits: Technologies, Digital Systems and Design Methodologies" ed. by Edward Fisher
ITExLi | 2019 | ISBN: 1789858488 9781789858488 178985847X 9781789858471 | 83 pages | PDF | 6 MB
This volume is dedicated to application-specific integrated circuits (ASICs. The book provides a small selection of chapters covering aspects of ASIC development and the surrounding business model.
The field of application-specific integrated circuits (ASICs) is fast-paced being at the very forefront of modern nanoscale fabrication - and presents a deeply engaging career path. ASICs can provide us with high-speed computation in the case of digital circuits. For example, central processing units, graphics processing units, field-programmable gate arrays, and custom-made digital signal processors are examples of ASICs and the transistors they are fabricated from. We can use that same technology - complementary metal-oxide semiconductor processes - to implement high-precision sensing of or interfacing to the world through analog-to-digital converters, digital-to-analog converters, custom image sensors, and highly integrated micron-scale sensors such as magnetometers, accelerometers, and microelectromechanical machines. ASIC technologies - now transitioning toward magneto-resistive and phase-changing materials - also offer digital memory capacities that have aided our technological progress. Combining these domains, we have moved toward big data analytics and the new era of artificial intelligence and machine learning.
1. Introductory Chapter: ASIC Technologies and Design Techniques
2. ASIC Commercialization Analysis: Technology Portfolios and the Innovative Performance of ASIC Firms during Technology Evolution
3. Case Study: First-Time Success ASIC Design Methodology Applied to a Multi-Processor System-on-Chip
4. Bio-Inspired Solutions and Its Impact on Real-World Problems: A Network on Chip (NoC) Perspective
5. Application of Optical Methods to Electronic Component Stress Analysis
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